Fabrication of nanocrystalline Ga2O3-NiO heterojunctions for large-area low-dose X-ray imaging

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Cite
Zhang, Zhipeng, et al. “Fabrication of Nanocrystalline Ga2O3-NiO Heterojunctions for Large-Area Low-Dose X-Ray Imaging”. Applied Surface Science, vol. 604, 2022, p. 154623, https://doi.org/10.1016/j.apsusc.2022.154623.
Zhang, Z., Chen, M., Zhan, R., Chen, H., Wang, K., Deng, S., & Chen, J. (2022). Fabrication of nanocrystalline Ga2O3-NiO heterojunctions for large-area low-dose X-ray imaging. Applied Surface Science, 604, 154623. https://doi.org/10.1016/j.apsusc.2022.154623
Zhang Z, Chen M, Zhan R, Chen H, Wang K, Deng S, et al. Fabrication of nanocrystalline Ga2O3-NiO heterojunctions for large-area low-dose X-ray imaging. Applied Surface Science. 2022;604:154623.
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Citations Analysis
The category Science: Chemistry 3 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled X-ray Detectors Based on Ga2O3 Microwires and was published in 2023. The most recent citation comes from a 2023 study titled X-ray Detectors Based on Ga2O3 Microwires. This article reached its peak citation in 2023, with 3 citations. It has been cited in 3 different journals. Among related journals, the Materials cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year