High-Performance X-ray Detector Based on Single-Crystal β-Ga2O3:Mg

Article Properties

• Language

  English
• DOI (url)

  10.1021/acsami.0c20574
• Publication Date

  2021/01/09
• Journal

  ACS Applied Materials & Interfaces
• Indian UGC (journal)
• Refrences

  52
• Citations

  33
• Jiawen Chen Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China
• Huili Tang Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China
• Bo Liu Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China ORCID
• Zhichao Zhu Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China
• Mu Gu Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China ORCID
• Zengxing Zhang State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, P. R. China ORCID
• Qiang Xu Department of Nuclear Science and Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China ORCID
• Jun Xu Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, P. R. China
• Leidang Zhou School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, China
• Liang Chen Northwest Institute of Nuclear Technology, Xi’an 710024, P. R. China
• Xiaoping Ouyang Northwest Institute of Nuclear Technology, Xi’an 710024, P. R. China