Guin, Ujjwal, et al. “Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead”. Journal of Electronic Testing, vol. 30, no. 1, 2014, pp. 9-23, https://doi.org/10.1007/s10836-013-5430-8.
Guin, U., DiMase, D., & Tehranipoor, M. (2014). Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead. Journal of Electronic Testing, 30(1), 9-23. https://doi.org/10.1007/s10836-013-5430-8
Guin U, DiMase D, Tehranipoor M. Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead. Journal of Electronic Testing. 2014;30(1):9-23.