Surface and Interface Analysis

Titel Veröffentlichungsdatum Sprache Zitate
Electrochemical and thermal oxidation of TiN coatings studied by XPS1995/07/01English184
Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays2014/02/03English184
XPS determination of uranium oxidation states2011/10/05English182
Angle‐resolved XPS studies of oxides at NbN, NbC, and Nb surfaces1987/06/01English181
Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001—surface chemical analysis—x‐ray photoelectron spectrometers—calibration of energy scales2001/08/01English180
Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness2002/07/24English178
Characteristics of silica‐coated TiO2 and its UV absorption for sunscreen cosmetic applications2006/03/29English178
Valence‐band x‐ray photoelectron spectroscopic studies of manganese and its oxides interpreted by cluster and band structure calculations2002/03/01English176
Effect of heat treatment on the properties and structure of TiO2 nanotubes: phase composition and chemical composition2010/02/17English173
Alteration of Ti 2p XPS spectrum for titanium oxide by low‐energy Ar ion bombardment2002/08/01English171
Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy2002/02/01English169
CONFIT: Mössbauer spectra fitting program2006/03/29English168
Calculations of electron inelastic mean free paths2005/01/01English167
Spectroscopy of carbon: from diamond to nitride films2012/02/16English162
Probing depth of soft x‐ray absorption spectroscopy measured in total‐electron‐yield mode1992/01/01English161
Organosilane self‐assembled monolayers formed at the vapour/solid interface2002/08/01English161
X‐ray photoelectron spectroscopy investigation of pumice‐supported nickel catalysts1995/04/01English160
Surface analysis of oxidized aluminium. 1. Hydration of Al2O3 and decomposition of Al(OH)3 in a vacuum as studied by ESCA1994/05/01English160
Viscosity effect on GaInSn studied by XPS2004/08/01English160
Atomic mixing, surface roughness and information depth in high‐resolution AES depth profiling of a GaAs/AlAs superlattice structure1994/09/01English159
The NIST x‐ray photoelectron spectroscopy database1992/06/01English156
AES: Energy calibration of electron spectrometers. I—an absolute, traceable energy calibration and the provision of atomic reference line energies1990/05/01English153
The effect of carbonate contaminations on the XPS O 1s band structure in metal oxides1991/03/01English151
ESCA Studies of MoO2 and MoO31988/10/01English150
Oxidation of an NiTi alloy1990/06/01English148
Influence of the surface chemistry on the wettability of stainless steel1994/09/01English148
XPS study of Fe(II)Fe(III) (oxy)hydroxycarbonate green rust compounds2008/02/06English147
Binding energy shifts for nitrogen‐containing graphene‐based electrocatalysts – experiments and DFT calculations2016/01/22English145
Intercomparison of surface analysis of thin aluminium oxide films1990/11/01English144
Quantification of oxide film thickness at the surface of aluminium using XPS2002/08/01English142