Surface and Interface Analysis

Titel Veröffentlichungsdatum Sprache Zitate
Characterization of CuO–ZnO catalysts by X‐ray photoelectron spectroscopy: Precursors, calcined and reduced samples1989/06/01English140
Surface investigation of carbon films: from diamond to graphite2010/04/22English140
Elastic scattering and quantification in AES and XPS1989/11/01English139
Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications2006/11/29English139
Film thickness measurements of SiO2 by XPS1994/01/01English137
An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference1992/01/01English137
XPS characterization of wood chemical composition after heat-treatment2006/09/04English136
Analytical TEM study on the dispersion of Au nanoparticles in Au/TiO2 catalyst prepared under various temperatures2001/02/01English135
Regularization: A stable and accurate method for generating depth profiles from angle‐dependent XPS data1989/08/01English135
Electron inelastic mean free paths in several solids for 200 eV ⩽ E ⩽ 10 keV1982/04/01English134
Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminium oxide layers2004/01/01English133
Plasma modification of PTFE surfaces. Part I: Surfaces immediately following plasma treatment2001/05/01English133
Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure–property relationships2001/01/01English133
Advances in charge neutralization for XPS measurements of nonconducting materials1988/04/01English131
Analysis of polymer surfaces by SIMS 1. An investigation of practical problems1982/06/01English130
Data compilations: their use to improve measurement certainty in surface analysis by aes and xps1986/07/01English129
XPS study of BN thin films deposited by CVD on SiC plane substrates1990/07/01English128
XPS study of the atmospheric corrosion of copper alloys of archaeological interest2004/08/01English127
XPS and ISS studies on the interaction of H2S with polycrystalline Cu, Cu2O and CuO surfaces1995/03/01English124
Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study2004/09/01English123
Practical methods for background subtraction in photoemission spectra2014/03/28English123
Experimental determination of electron inelastic mean free paths in 13 elemental solids in the 50 to 5000 eV energy range by elastic‐peak electron spectroscopy2005/10/31English122
Development of a methodology for XPS curve‐fitting of the Si 2p core level of siloxane materials2004/09/14English122
X‐Ray photoelectron spectroscopic studies of the surface of sputter ion plated films1984/12/01English122
On the role of Gibbsian segregation in causing preferential sputtering1985/02/01English119
XPS and AES study of antimony oxides1980/10/01English118
XPS reference procedure for the accurate intensity calibration of electron spectrometers— results of a BCR intercomparison co‐sponsored by the VAMAS SCA TWA1993/03/01English118
Optical microarray biosensing techniques2006/10/18English113
Static time‐of‐flight secondary ion mass spectrometry and x‐ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films2001/08/01English113
XPS study of passive films formed on molybdenum‐implanted austenitic stainless steels1992/06/01English113