Surface and Interface Analysis

Titel Veröffentlichungsdatum Sprache Zitate
Electron transport in solids for quantitative surface analysis2001/03/01English278
Editorial1979/02/01English268
XPS analysis of aluminum nitride films deposited by plasma source molecular beam epitaxy2008/06/23English261
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm2015/07/23English260
Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering2001/10/01English255
Systematic x‐ray photoelectron spectroscopic study of La1−xSrx‐based perovskite‐type oxides2002/04/23English254
Quantitative depth profiling in surface analysis: A review1980/08/01English250
The X‐ray photoelectron spectra of Ir, IrO2 and IrCl3 revisited2017/03/02English245
Accounting for Poisson noise in the multivariate analysis of ToF‐SIMS spectrum images2004/03/01English241
XPS depth profile analysis of non‐stoichiometric NiO films2004/01/01English240
Comparison between XPS‐ and FTIR‐analysis of plasma‐treated polypropylene film surfaces2008/03/01English238
Reproducible XPS on biopolymers: cellulose studies2004/08/01English233
Oxidation of magnesium2002/08/01English231
XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies1984/06/01English231
Surface modification of polyester by oxygen‐ and nitrogen‐plasma treatment2008/10/10English225
A new examination of secondary electron yield data2005/10/31English224
Interactions of CO2 and CO at fractional atmosphere pressures with iron and iron oxide surfaces: one possible mechanism for surface contamination?2002/03/08English223
Determination of peak positions and areas from wide‐scan XPS spectra1990/03/01English222
XPS analysis of bio‐organic systems2011/10/12English221
X‐ray photoelectron spectroscopic studies of thin film oxides of cobalt and molybdenum1990/04/01English217
Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy2005/10/31English216
Surface film formation on a graphite electrode in Li‐ion batteries: AFM and XPS study2005/07/28English213
ARXPS characterisation of plasma polymerised surface chemical gradients2006/10/18English212
Handbook of X‐ray Photoelectron Spectroscopy C. D. Wanger, W. M. Riggs, L. E. Davis, J. F. Moulder and G. E.Muilenberg Perkin‐Elmer Corp., Physical Electronics Division, Eden Prairie, Minnesota, USA, 1979. 190 pp. $1951981/08/01English208
Quantitative analysis of complex amino acids and RGD peptides by X‐ray photoelectron spectroscopy (XPS)2013/04/11English207
Post‐1989 calibration energies for X‐ray photoelectron spectrometers and the 1990 Josephson constant1989/08/01English205
XPS and Raman spectroscopic characterization of LiMn2O4 spinels2005/03/22English204
XPS MultiQuant: multimodel XPS quantification software2004/08/01English197
The energy dependence of the electron mean free path1980/04/01English196
An x‐ray photoelectron spectroscopic study of some chromium–oxygen systems1988/11/01English185