Surface and Interface Analysis

Titel Veröffentlichungsdatum Sprache Zitate
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids1979/02/01English4,407
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds2004/10/07English2,685
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range1994/03/01English2,013
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis1981/10/01English1,764
X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems2009/01/28English1,272
Advanced analysis of copper X‐ray photoelectron spectra2017/05/12English1,059
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range1991/12/01English1,055
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)2008/01/21English897
Calculations of electron inelastic mean free paths for 31 materials1988/08/01English813
Resolving ruthenium: XPS studies of common ruthenium materials2015/09/22English715
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range2011/02/08English686
Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50–2000 eV range1991/12/01English574
XPS O 1s binding energies for polymers containing hydroxyl, ether, ketone and ester groups1991/05/01English537
XPS Study of the reduction of cerium dioxide1993/05/30English532
X‐ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides1992/01/01English484
An ESCA method for determining the oxide thickness on aluminum alloys1990/01/01English467
XPS study of supported gold catalysts: the role of Au0 and Au+δ species as active sites2006/03/29English426
X‐ray photoelectron spectroscopy studies of chromium compounds2004/10/07English408
Quantitative analysis of the inelastic background in surface electron spectroscopy1988/06/01English378
Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP‐2M IMFP predictive equation2003/02/11English372
Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP‐2 for electron energies between 50 and 2000 eV1993/01/01English366
Adventitious carbon—the panacea for energy referencing?1982/04/01English357
The quantitative analysis of surfaces by XPS: A review1980/12/01English346
Deconvolution as a correction for photoelectron inelastic energy losses in the core level XPS spectra of iron oxides1987/03/01English321
Raman spectroscopy of GaN, AlGaN and AlN for process and growth monitoring/control2001/10/01English307
Stoichiometric vanadium oxides studied by XPS2011/10/27English306
Auger parameter measurements of zinc compounds relevant to zinc transport in the environment1989/01/01English306
XPS determination of oxygen‐containing functional groups on carbon‐fibre surfaces and the cleaning of these surfaces1990/10/01English292
The electronic structure of iridium and its oxides2015/12/28English287
Differentiating calcium carbonate polymorphs by surface analysis techniques—an XPS and TOF‐SIMS study2008/09/02English282