nGepGaAs Heterojunctions | 1966/11/01 | English | 162 |
Ordered arrays of quantum dots: Formation, electronic spectra, relaxation phenomena, lasing | 1996/01/01 | English | 160 |
Analysis of a proposed bistable injection laser | 1964/10/01 | English | 160 |
Interface states in abrupt semiconductor heterojunctions | 1964/02/01 | English | 158 |
Alloy scattering and high field transport in ternary and quaternary III–V semiconductors | 1978/01/01 | English | 153 |
Threshold energy effect on avalanche breakdown voltage in semiconductor junctions | 1975/02/01 | English | 153 |
CdTe solar cells and photovoltaic heterojunctions in II–VI compounds | 1963/05/01 | English | 152 |
Ultraviolet photoconductive detector with high visible rejection and fast photoresponse based on ZnO thin film | 2007/05/01 | English | 151 |
Theory of tunneling into interface states | 1970/11/01 | English | 149 |
Controllable design of solid-state perovskite solar cells by SCAPS device simulation | 2016/12/01 | English | 147 |
An accurate numerical steady-state one-dimensional solution of the P-N junction | 1968/01/01 | English | 147 |
Surface and interface depletion corrections to free carrier-density determinations by hall measurements | 1979/07/01 | English | 147 |
Use of a Schottky barrier to measure impact ionization coefficients in semiconductors | 1973/03/01 | English | 147 |
A physical model for the dependence of carrier lifetime on doping density in nondegenerate silicon | 1982/08/01 | English | 144 |
Calculation of avalanche breakdown voltages of silicon p-n junctions | 1967/01/01 | English | 143 |
Ohmic contacts to III–V compound semiconductors: A review of fabrication techniques | 1983/03/01 | English | 142 |
Numerical modeling of abrupt heterojunctions using a thermionic-field emission boundary condition | 1993/03/01 | English | 141 |
Metal-silicon Schottky barriers | 1968/03/01 | English | 140 |
Intermetallic formation in gold-aluminum systems | 1970/10/01 | English | 139 |
Carrier recombination and lifetime in highly doped silicon | 1983/06/01 | English | 139 |
An analysis on the ambipolar current in Si double-gate tunnel FETs | 2012/04/01 | English | 138 |
Control of relative etch rates of SiO2 and Si in plasma etching | 1975/12/01 | English | 138 |
Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric | 2007/11/01 | English | 137 |
AC performance of nanoelectronics: towards a ballistic THz nanotube transistor | 2004/10/01 | English | 136 |
Electrical properties of poly-Ge on glass substrate grown by two-step solid-phase crystallization | 2009/11/01 | English | 135 |
Theoretical analysis of the series resistance of a solar cell | 1967/08/01 | English | 133 |
Impurity centers in PN junctions determined from shifts in the thermally stimulated current and capacitance response with heating rate | 1972/01/01 | English | 133 |
Carrier transport near the Si/SiO2 interface of a MOSFET | 1989/10/01 | English | 132 |
Electrical characteristics of GaAs MIS Schottky diodes | 1979/07/01 | English | 131 |
Hydrogen-induced improvements in electrical characteristics of a-IGZO thin-film transistors | 2010/12/01 | English | 131 |