HRTEM Characterization of Atomic Structures in Cu/.ALPHA.-Al2O3(0001) Interface

Article Properties
Citations
Title Journal Journal Categories Citations Publication Date
The interface structure and band alignment at alumina/Cu(Al) alloy interfaces—Influence of the crystallinity of alumina films Applied Surface Science
  • Science: Chemistry: Physical and theoretical chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
15 2010
Interface termination and band alignment of epitaxially grown alumina films on Cu–Al alloy

Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
21 2008
Theoretical Studies of the Atomic and Electronic Structure of Nano-Hetero Metal/Inorganic Material Interfaces in Collaboration with Electron Microscopy Observations MATERIALS TRANSACTIONS
  • Science: Chemistry
  • Technology: Mining engineering. Metallurgy
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
12 2007
First-principles study of the adhesive and mechanical properties of the O-terminatedα-Al2O3(0001)/Cu(111) interfaces Philosophical Magazine
  • Science: Chemistry
  • Technology: Mining engineering. Metallurgy
  • Science: Physics
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
18 2006
Influence of Interface Structure on Schottky Barrier Heights of &alpha;-Al<SUB>2</SUB>O<SUB>3</SUB>(0001)/Ni(111) interfaces: A First-Principles Study MATERIALS TRANSACTIONS
  • Science: Chemistry
  • Technology: Mining engineering. Metallurgy
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
15 2006
Citations Analysis
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials 12 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Atomic and electronic structures of Cu/a-Al2O3 interfaces prepared by pulsed-laser deposition and was published in 2003. The most recent citation comes from a 2010 study titled The interface structure and band alignment at alumina/Cu(Al) alloy interfaces—Influence of the crystallinity of alumina films. This article reached its peak citation in 2005, with 5 citations. It has been cited in 9 different journals, 22% of which are open access. Among related journals, the MATERIALS TRANSACTIONS cited this research the most, with 4 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year