Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
Resistivity scaling in epitaxial MAX-phase Ti4SiC3(0001) layers | Journal of Applied Physics |
| 10 | 2021 |
Resistivity size effect in epitaxial iridium layers | Journal of Applied Physics |
| 17 | 2021 |
Interdiffusion reliability and resistivity scaling of intermetallic compounds as advanced interconnect materials | Journal of Applied Physics |
| 14 | 2021 |
10.1109/TED.2020.3040202 | IEEE Transactions on Electron Devices |
| 2021 | |
10.1103/PhysRevMaterials.5.056002 | 2021 |
Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
Multi‐Objective Optimization for Rapid Identification of Novel Compound Metals for Interconnect Applications | Small |
| 2024 | |
A computational investigation of electron transport in defected Cu thin films | Computational Materials Science |
| 2024 | |
Understanding electromigration failure behaviors of narrow cobalt lines and the mechanism of reliability enhancement for extremely dilute alloying of manganese oxide | Journal of Alloys and Compounds |
| 2024 | |
Tuning the electronic conductance of REH (RE = Nd, Ce, Pr) by structural deformation | Journal of Energy Chemistry |
| 2024 | |
High-throughput approach to explore cold metals for electronic and thermoelectric devices | npj Computational Materials |
| 2024 |