Detection of catastrophic faults in analog integrated circuits

Article Properties
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Technology
Engineering (General)
Civil engineering (General)
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Refrences
Title Journal Journal Categories Citations Publication Date
Computational geometry?A survey 1984
Variational analysis of integrated circuits 1986
A robust simulation-before-test technique for DC analog fault diagnosis 1984
Fault characterization of VLSI MOS circuits 1982
Computer-aided design application to fault detection and isolation techniques 1977
Citations
Title Journal Journal Categories Citations Publication Date
Combined Optimization of Neural Network Fault Diagnosis Methods for Analog Circuits on Ships Journal of Coastal Research
  • Geography. Anthropology. Recreation: Environmental sciences
  • Geography. Anthropology. Recreation: Geography (General)
  • Science: Geology
 2020
Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model IEEE Access
  • Technology: Electrical engineering. Electronics. Nuclear engineering
  • Science: Science (General): Cybernetics: Information theory
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Telecommunication
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
 2018
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes IEEE Design & Test
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
 2018
Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters Circuits, Systems, and Signal Processing
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
 6 2017
Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations Circuits, Systems, and Signal Processing
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
 4 2017
Citations Analysis
Category Category Repetition
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks49
Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics42
Technology: Engineering (General). Civil engineering (General)30
Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware23
Science: Mathematics: Instruments and machines: Electronic computers. Computer science19
Science: Mathematics: Instruments and machines6
Technology: Chemical technology5
Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software4
Technology: Electrical engineering. Electronics. Nuclear engineering1
Science: Science (General): Cybernetics: Information theory1
Technology: Electrical engineering. Electronics. Nuclear engineering: Telecommunication1
Science: Physics1
Geography. Anthropology. Recreation: Environmental sciences1
Geography. Anthropology. Recreation: Geography (General)1
Science: Geology1
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks 49 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Fault diagnosis in analog circuits using element modulation and was published in 1992. The most recent citation comes from a 2020 study titled Combined Optimization of Neural Network Fault Diagnosis Methods for Analog Circuits on Ships. This article reached its peak citation in 1999, with 7 citations. It has been cited in 22 different journals, 4% of which are open access. Among related journals, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems cited this research the most, with 15 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year