An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes

Article Properties
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Computer software
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Refrences
Title Journal Journal Categories Citations Publication Date
Built-in test of millimeter-wave circuits based on non-intrusive sensors 2016
Current-mode BIST structure for mixed-signal circuits 2002
10.1109/ETS.2011.22
10.1109/ETS.2008.18
10.1109/VTEST.1995.512618