The Schrödinger–Poisson self-consistency in layered quantum semiconductor structures

Article Properties
  • Language
    English
  • DOI (url)
  • Publication Date
    2004/03/15
  • Indian UGC (journal)
  • Refrences
    50
  • Citations
    27
  • L. R. Ram-Mohan Departments of Physics, Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, Massachusetts 01609
  • K. H. Yoo Department of Physics and Research Institute for Basic Sciences, Kyung Hee University, Seoul, 130-701, Korea
  • J. Moussa Department of Physics, Worcester Polytechnic Institute, Worcester, Massachusetts 01609
Abstract
Cite
Ram-Mohan, L. R., et al. “The Schrödinger–Poisson Self-Consistency in Layered Quantum Semiconductor Structures”. Journal of Applied Physics, vol. 95, no. 6, 2004, pp. 3081-92, https://doi.org/10.1063/1.1649458.
Ram-Mohan, L. R., Yoo, K. H., & Moussa, J. (2004). The Schrödinger–Poisson self-consistency in layered quantum semiconductor structures. Journal of Applied Physics, 95(6), 3081-3092. https://doi.org/10.1063/1.1649458
Ram-Mohan LR, Yoo KH, Moussa J. The Schrödinger–Poisson self-consistency in layered quantum semiconductor structures. Journal of Applied Physics. 2004;95(6):3081-92.
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Refrences
Title Journal Journal Categories Citations Publication Date
Band parameters for III–V compound semiconductors and their alloys

Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
5,390 2001
10.1016/S0026-2692(99)00057-9 Microelectronics Journal
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
1999
Hierarchy of simulation approaches for hot carrier transport in deep submicron devices Semiconductor Science and Technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
20 1998
Iteration scheme for the solution of the two-dimensional Schrödinger-Poisson equations in quantum structures

Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
175 1997
10.1142/S0218863595000094 1995
Citations
Title Journal Journal Categories Citations Publication Date
The cell-centered Finite-Volume self-consistent approach for heterostructures: 1D electron gas at the Si–SiO2 interface

Journal of Physics: Condensed Matter
  • Technology: Chemical technology
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
2023
Band structure and strain distribution of InAs quantum dots encapsulated in (Al)GaAs asymmetric matrixes

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2023
Analysis of Improved 2D Electron Gas Mobility in InAlN/AlN/InGaN High‐Electron‐Mobility Transistors with GaN Interlayer

physica status solidi (RRL) – Rapid Research Letters
  • Science: Chemistry
  • Science: Physics
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
3 2022
Gate control of interlayer exchange coupling in ferromagnetic semiconductor trilayers with perpendicular magnetic anisotropy

APL Materials
  • Technology: Chemical technology: Biotechnology
  • Science: Physics
  • Technology: Chemical technology
  • Science: Chemistry
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2022
The Effects of Temperature and Electric Field on the Electronic and Optical Properties of an InAs Quantum Dot Placed at the Center of a GaAs Nanowire Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
  • Science: Physics
2022
Citations Analysis
The category Science: Physics 17 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Spectral Element Method for the Schrödinger-Poisson System and was published in 2004. The most recent citation comes from a 2023 study titled The cell-centered Finite-Volume self-consistent approach for heterostructures: 1D electron gas at the Si–SiO2 interface. This article reached its peak citation in 2022, with 3 citations. It has been cited in 21 different journals, 9% of which are open access. Among related journals, the Physical Review B cited this research the most, with 4 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year