Estimating Depolarization with the Jones Matrix Quality Factor

Article Properties
  • Language
    English
  • Publication Date
    2017/11/01
  • Indian UGC (journal)
  • Refrences
    14
  • Citations
    10
  • James N. Hilfiker
  • Jeffrey S. Hale
  • Craig M. Herzinger
  • Tom Tiwald
  • Nina Hong
  • Stefan Schöche
  • Hans Arwin
Cite
Hilfiker, James N., et al. “Estimating Depolarization With the Jones Matrix Quality Factor”. Applied Surface Science, vol. 421, 2017, pp. 494-9, https://doi.org/10.1016/j.apsusc.2016.08.139.
Hilfiker, J. N., Hale, J. S., Herzinger, C. M., Tiwald, T., Hong, N., Schöche, S., & Arwin, H. (2017). Estimating Depolarization with the Jones Matrix Quality Factor. Applied Surface Science, 421, 494-499. https://doi.org/10.1016/j.apsusc.2016.08.139
Hilfiker, James N., Jeffrey S. Hale, Craig M. Herzinger, Tom Tiwald, Nina Hong, Stefan Schöche, and Hans Arwin. “Estimating Depolarization With the Jones Matrix Quality Factor”. Applied Surface Science 421 (2017): 494-99. https://doi.org/10.1016/j.apsusc.2016.08.139.
Hilfiker JN, Hale JS, Herzinger CM, Tiwald T, Hong N, Schöche S, et al. Estimating Depolarization with the Jones Matrix Quality Factor. Applied Surface Science. 2017;421:494-9.
Refrences
Title Journal Journal Categories Citations Publication Date
10.1364/AO.44.002490 Applied Optics
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Science: Physics: Acoustics. Sound
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
2005
10.1364/OE.23.001951 Optics Express
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics: Optics. Light
  • Science: Physics
2015
10.1364/OE.21.022645 Optics Express
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics: Optics. Light
  • Science: Physics
2013
Depolarization and Polarization Indices of an Optical System Optica Acta: International Journal of Optics 173 1986
Dielectric function representation by B-splines 2008
Citations
Title Journal Journal Categories Citations Publication Date
Mueller Matrix Polarizing Power

Photonics
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics: Acoustics. Sound
  • Science: Physics: Optics. Light
  • Science: Physics: Optics. Light
  • Science: Physics
2024
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

Nanomaterials
  • Science: Chemistry
  • Science: Chemistry: General. Including alchemy
  • Technology: Chemical technology
  • Science: Chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2023
Mueller matrix spectroscopic ellipsometry

Advanced Optical Technologies
  • Technology
  • Science: Physics: Optics. Light
15 2022
On the optimization of knot allocation for B-spline parameterization of the dielectric function in spectroscopic ellipsometry data analysis

Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
9 2021
Observation of mixed types of energy gaps in some II–VI semiconductors nanostructured films: towards enhanced solar cell performance Applied Physics A
  • Science: Chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
6 2020
Citations Analysis
The category Technology: Chemical technology 8 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Giant intrinsic circular dichroism of prolinol-derived squaraine thin films and was published in 2018. The most recent citation comes from a 2024 study titled Mueller Matrix Polarizing Power. This article reached its peak citation in 2019, with 3 citations. It has been cited in 10 different journals, 40% of which are open access. Among related journals, the Photonics cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year