Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
10.1364/AO.44.002490 | Applied Optics |
| 2005 | |
10.1364/OE.23.001951 | Optics Express |
| 2015 | |
10.1364/OE.21.022645 | Optics Express |
| 2013 | |
Depolarization and Polarization Indices of an Optical System | Optica Acta: International Journal of Optics | 173 | 1986 | |
Dielectric function representation by B-splines | 2008 |
Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
Mueller Matrix Polarizing Power | Photonics |
| 2024 | |
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample | Nanomaterials |
| 2023 | |
Mueller matrix spectroscopic ellipsometry | Advanced Optical Technologies |
| 15 | 2022 |
On the optimization of knot allocation for B-spline parameterization of the dielectric function in spectroscopic ellipsometry data analysis | Journal of Applied Physics |
| 9 | 2021 |
Observation of mixed types of energy gaps in some II–VI semiconductors nanostructured films: towards enhanced solar cell performance | Applied Physics A |
| 6 | 2020 |