Mueller matrix spectroscopic ellipsometry

Article Properties
  • Language
    English
  • DOI (url)
    10.1515/aot-2022-0008
  • Publication Date
    2022/06/07
  • Journal
    Advanced Optical Technologies
  • Indian UGC (journal)
  • Refrences
    87
  • Citations
    15
  • James N. Hilfiker J.A. Woollam Company , 311 South 7th St. , Lincoln , NE , 68508 , USA ORCID (unauthenticated)
  • Nina Hong J.A. Woollam Company , 311 South 7th St. , Lincoln , NE , 68508 , USA
  • Stefan Schoeche J.A. Woollam Company , 311 South 7th St. , Lincoln , NE , 68508 , USA
Abstract
Cite
Hilfiker, James N., et al. “Mueller Matrix Spectroscopic Ellipsometry”. Advanced Optical Technologies, vol. 11, no. 3-4, 2022, pp. 59-91, https://doi.org/10.1515/aot-2022-0008.
Hilfiker, J. N., Hong, N., & Schoeche, S. (2022). Mueller matrix spectroscopic ellipsometry. Advanced Optical Technologies, 11(3-4), 59-91. https://doi.org/10.1515/aot-2022-0008
Hilfiker, James N., Nina Hong, and Stefan Schoeche. “Mueller Matrix Spectroscopic Ellipsometry”. Advanced Optical Technologies 11, no. 3-4 (2022): 59-91. https://doi.org/10.1515/aot-2022-0008.
Hilfiker JN, Hong N, Schoeche S. Mueller matrix spectroscopic ellipsometry. Advanced Optical Technologies. 2022;11(3-4):59-91.
Journal Categories
Science
Physics
Optics
Light
Technology
Refrences
Title Journal Journal Categories Citations Publication Date
3D Mueller matrix mapping of layered distributions of depolarisation degree for analysis of prostate adenoma and carcinoma diffuse tissues

 Scientific Reports
  • Medicine
  • Science
  • Science: Science (General)
 26 2021
Tunable plasmonic resonances in Si-Au slanted columnar heterostructure thin films

 Scientific Reports
  • Medicine
  • Science
  • Science: Science (General)
 9 2019
THz dielectric anisotropy of metal slanted columnar thin films Applied Physics Letters
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
 29 2011
10.1364/JOSAA.13.001106
Mueller calculus and perfect polarization conversion modes in liquid crystal displays

 Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
 12 2001
Citations
Title Journal Journal Categories Citations Publication Date
Impact of Temperature on the Chiroptical Properties of Thin Films of Chiral Thiophene‐based Oligomers

 ChemPlusChem
  • Science: Chemistry: General. Including alchemy
  • Science: Chemistry
 2024
A 2D chiral microcavity based on apparent circular dichroism

 Nature Communications
  • Science
  • Science: Science (General)
 2024
Tackling the inverse problem in ellipsometry: analytic expressions for supported coatings with nonuniform refractive index profiles in the thin film and weak contrast limits

 Physica Scripta
  • Science: Physics
  • Science: Physics
 2024
Detection of structural asymmetries in Forksheet FET arrays using Mueller matrix ellipsometry: a theoretical study Journal of Micro/Nanopatterning, Materials, and Metrology 2024
Small random library method combined with local searching in optical critical dimension measurements

 Applied Optics
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Science: Physics: Acoustics. Sound
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
 2024
Citations Analysis
Category Category Repetition
Science: Physics8
Technology: Chemical technology8
Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials8
Science: Chemistry7
Science: Physics: Optics. Light5
Science: Chemistry: General. Including alchemy3
Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics3
Science: Physics: Acoustics. Sound3
Technology: Engineering (General). Civil engineering (General)1
Science: Biology (General)1
Technology: Technology (General): Industrial engineering. Management engineering1
Science1
Science: Science (General)1
The category Science: Physics 8 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Spectroscopic Ellipsometry: Advancements, Applications and Future Prospects in Optical Characterization and was published in 2023. The most recent citation comes from a 2024 study titled A 2D chiral microcavity based on apparent circular dichroism. This article reached its peak citation in 2023, with 9 citations. It has been cited in 13 different journals, 30% of which are open access. Among related journals, the Applied Optics cited this research the most, with 2 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year