Maximum likelihood unsupervised textured image segmentation

Article Properties
Cite
Cohen, Fernand S, and Zhigang Fan. “Maximum Likelihood Unsupervised Textured Image Segmentation”. CVGIP: Graphical Models and Image Processing, vol. 54, no. 3, 1992, pp. 239-51, https://doi.org/10.1016/1049-9652(92)90054-2.
Cohen, F. S., & Fan, Z. (1992). Maximum likelihood unsupervised textured image segmentation. CVGIP: Graphical Models and Image Processing, 54(3), 239-251. https://doi.org/10.1016/1049-9652(92)90054-2
Cohen, Fernand S, and Zhigang Fan. “Maximum Likelihood Unsupervised Textured Image Segmentation”. CVGIP: Graphical Models and Image Processing 54, no. 3 (1992): 239-51. https://doi.org/10.1016/1049-9652(92)90054-2.
Cohen FS, Fan Z. Maximum likelihood unsupervised textured image segmentation. CVGIP: Graphical Models and Image Processing. 1992;54(3):239-51.
Refrences
Title Journal Journal Categories Citations Publication Date
Stochastic and deterministic networks for texture segmentation IEEE Transactions on Acoustics, Speech, and Signal Processing 52 1990
On optimally combining pieces of information with application to estimating 3D complex-object position from range data 1986
Stochastic boundary estimation and object recognition 1980
When should a machine ask for help? 1974
Modelling and segmentation of noisy and textured images using Gibbs random fields 1987
Refrences Analysis
Category Category Repetition
Science: Biology (General)2
Science: Science (General): Cybernetics: Information theory1
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks1
Technology: Technology (General): Industrial engineering. Management engineering: Information technology1
Technology: Electrical engineering. Electronics. Nuclear engineering: Telecommunication1
Science: Mathematics: Instruments and machines: Electronic computers. Computer science1
Medicine: Medicine (General): Computer applications to medicine. Medical informatics1
Science: Mathematics: Probabilities. Mathematical statistics1
Science: Mathematics1
The category Science: Biology (General) 2 is the most frequently represented among the references in this article. It primarily includes studies from IEEE Transactions on Information Theory and Biometrika. The chart below illustrates the number of referenced publications per year.
Refrences used by this article by year
Citations
Title Journal Journal Categories Citations Publication Date
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces IEEE Transactions on Industrial Informatics
  • Technology: Mechanical engineering and machinery
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Technology (General): Industrial engineering. Management engineering: Information technology
  • Technology: Technology (General): Industrial engineering. Management engineering
  • Technology: Engineering (General). Civil engineering (General)
 1 2011
Applying wavelets transform and support vector machine for copper clad laminate defects classification Computers & Industrial Engineering
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Technology (General): Industrial engineering. Management engineering: Information technology
  • Technology: Technology (General): Industrial engineering. Management engineering
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
 16 2009
Applying wavelets transform, rough set theory and support vector machine for copper clad laminate defects classification Expert Systems with Applications
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Manufactures: Production management. Operations management
  • Technology: Mechanical engineering and machinery
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
 15 2009
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures Image and Vision Computing
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics: Optics. Light
  • Technology: Mechanical engineering and machinery
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
 15 2005
Automatic band selection for wavelet reconstruction in the application of defect detection Image and Vision Computing
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics: Optics. Light
  • Technology: Mechanical engineering and machinery
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
 2003
Citations Analysis
Category Category Repetition
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks16
Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics16
Science: Mathematics: Instruments and machines: Electronic computers. Computer science16
Technology: Mechanical engineering and machinery14
Technology: Engineering (General). Civil engineering (General)11
Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software4
Science: Physics: Optics. Light4
Science: Geology2
Technology: Technology (General): Industrial engineering. Management engineering: Information technology2
Technology: Technology (General): Industrial engineering. Management engineering2
Geography. Anthropology. Recreation: Geography (General)1
Technology: Photography1
Technology: Manufactures: Production management. Operations management1
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks 16 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Tracking of unknown nonstationary chirp signals using unsupervised clustering in the Wigner distribution space and was published in 1993. The most recent citation comes from a 2011 study titled Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces. This article reached its peak citation in 2003, with 3 citations. It has been cited in 11 different journals. Among related journals, the IEEE Transactions on Pattern Analysis and Machine Intelligence cited this research the most, with 6 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year