IEEE Design & Test

Title Publication Date Language Citations
Impact of FinFET on Near-Threshold Voltage Scalability2017/04/01
STLs for GPUs: Using High-Level Language Approaches2023/08/01
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications2023/08/01
Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation2023/08/01
Five Years Teaching Ethics and Computing2024/02/01
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores2023/10/01
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security2024/04/01
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security2024/04/01
Front Cover2024/04/01
IEEE Design & Test Publication Information2024/04/01
Predictions2024/04/01
Table of Contents2024/04/01
Blank Page2024/04/01
Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023)2024/04/01
Report on the 2023 Embedded Systems Week (ESWEEK)2024/04/01
IEEE Design & Test Publication Information2023/10/01
The Future of Design for Test and Silicon Lifecycle Management2024/01/01
Fuzzing for Automated SoC Security Verification: Challenges and Solution2024/01/01
The 28th IEEE European Test Symposium2024/02/01
Front Cover2024/02/01
Losing My Memory2024/02/01
Ethics in Computing2024/02/01
Special Issue on Ethics in Computing2024/02/01
ISLPED 2023: International Symposium on Low-Power Electronics and Design2024/02/01
IEEE Design & Test Publication Information2024/02/01
Table of Contents2024/02/01
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology2024/02/01
Integrating Machine-Learning Probes in FPGA CAD: Why and How?2023/10/01
Seamless Thermal Optimization of Parallel Workloads2023/10/01
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology2024/04/01