Title	Publication Date	Language	Citations
IEEE Design & Test	2016/08/01
Ultralow Power and the New Era of Not-So-VLSI	2016/08/01
Test Technology TC Newsletter	2016/08/01
Recap of the 2016 DATE Conference & Exhibition	2016/08/01
Optimization of a Dual-Band Wireless Power and Data Telemetry System Using Genetic Algorithm	2018/06/01
Front Cover	2016/08/01
Open Access Publishing	2016/08/01
IEEE Design & Test of Computers publication information	2016/08/01
My IEEE	2016/08/01
IEEE Semantic	2016/08/01
Table of Contents	2016/08/01
IEEE	2016/08/01
Guest Editors' Introduction: Implantable Medical Devices	2016/08/01
Cover 2	2016/08/01
CEDA Currents	2016/08/01
EM-Based On-Chip Aging Sensor for Detection of Recycled ICs	2016/10/01
The Intestinal Superhighway	2016/08/01
IEEE Design&Test publication information	2016/12/01
Corrections	2016/12/01
ITC and the Future of Test—We've Won	2016/12/01
Cover 4	2016/12/01
Guest Editors' Introduction: Top Papers from the 2015 International Test Conference	2016/12/01
The 2016 DAC Art Show Winner: Misha Temkin	2016/12/01
Best in Test	2016/12/01
Cover 2	2016/12/01
Recap of the 2016 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED 2016)	2016/12/01
Front Cover	2016/12/01
Table of Contents	2016/12/01
Cover 3	2016/12/01
Can Dark Silicon Be Exploited to Prolong System Lifetime?	2017/04/01