Can we see the birth of a thin film, atom by atom? This research pioneers a modified transmission electron microscope (TEM) to observe the initial stages of thin film growth via ion beam sputtering. The focus is on understanding the fundamental processes that govern how thin films form, with silver as a primary material studied. The study details the modification of a commercial TEM to enable *in-situ* observation. Silver, silicon, and niobium were sputtered onto various substrates, including carbon, mica, and graphite. While silver growth on carbon proved difficult to analyze quantitatively due to the formation of abnormal islands, more reproducible results were obtained on mica and graphite. Despite variations in substrate, the study found that sputter-deposited silver films exhibit similar nucleation and early growth features to evaporated films. Preliminary results on silicon and niobium growth are also presented, opening avenues for further investigation of other materials. This work lays the groundwork for precise control over thin film properties through a deeper understanding of their formation mechanisms.
This article is difficult to contextualize due to a lack of journal categories. The journal, Journal of Vacuum Science and Technology, typically covers topics related to materials science and surface engineering. This paper would be relevant to the journal as it deals with the growth and characterization of thin films, which is a crucial area within vacuum science and technology.