Unlocking the power of EXAFS analysis for material science: This paper presents advanced features of FEFF and FEFFIT, powerful tools for analyzing Extended X-ray Absorption Fine Structure (EXAFS) data. By employing the scattering path formalism from FEFF and cumulant expansion, the research offers a flexible and robust approach to parameterizing EXAFS problems. The research emphasizes the ability to model EXAFS data in terms of generalized physical variables, providing a deeper understanding of material properties. A practical example demonstrates the simultaneous refinement of two different polarizations for Co K EXAFS data of \rm CoPt_{3}, showcasing the tools' capabilities and the physical insights they provide. This methodology enables researchers to explore material structures, electronic states, and local atomic environments with unprecedented accuracy. By utilizing these refined analysis techniques, scientists can gain deeper insights into the functional properties of materials, leading to innovations in materials science and engineering.
This paper in the Journal of Synchrotron Radiation fits squarely within the journal's focus on advancements in synchrotron science. By detailing enhancements to EXAFS analysis using FEFF and FEFFIT, the article provides valuable tools and methods for researchers utilizing synchrotron techniques. The work significantly contributes to the journal's ongoing coverage of cutting-edge developments in structural characterization and materials science, highly valued by its readership.