IEEE Transactions on Electron Devices

Title Publication Date Language Citations
MOSFET Performance Scaling—Part II: Future Directions2008/06/012
The Ground Plane in Buried Oxide for Controlling Short-Channel Effects in Nanoscale SOI MOSFETs2008/06/012
Thermal Analysis of a Helix TWT Slow-Wave Structure2008/05/012
Band-Structure Effects on the Performance of III–V Ultrathin-Body SOI MOSFETs2008/05/011
Modeling Thermal Effects in Nanodevices2008/06/011
Universal Potential Model in Tied and Separated Double-Gate MOSFETs With Consideration of Symmetric and Asymmetric Structure2008/06/011
Evaluation of Hot-Electron Effect on LDMOS Device and Circuit Performances2008/06/011
Characteristic Instabilities in HfAlO Metal–Insulator–Metal Capacitors Under Constant-Voltage Stress2008/06/011
Two-Dimensional Tunneling Effects on the Leakage Current of MOSFETs With Single Dielectric and High-$\kappa$ Gate Stacks2008/06/011
Experimental Characterization of the Vertical Position of the Trapped Charge in Si Nitride-Based Nonvolatile Memory Cells2008/05/01
Optimization of Gate Leakage and NBTI for Plasma-Nitrided Gate Oxides by Numerical and Analytical Models2008/05/01
Evaluation of Transmission Line Model Structures for Silicide-to-Silicon Specific Contact Resistance Extraction2008/05/01
(111)-Faceted Metal Source and Drain for Aggressively Scaled Metal/High-<formula formulatype="inline"><tex> $k$</tex></formula> MISFETs2008/05/01
Optimal Dual-$V_{T}$ Design in Sub-100-nm PD/SOI and Double-Gate Technologies2008/05/01
Power Density and Efficiency of Thermophotovoltaic Energy Conversion Using a Photonic-Crystal Emitter and a <formula formulatype="inline"><tex>$\hbox{2}$</tex> </formula>-D Metal-Grid Filter2008/05/01
A Model With Temperature-Dependent Exponent for Hot-Carrier Injection in High-Voltage nMOSFETs Involving Hot-Hole Injection and Dispersion2008/05/01
RF Small-Signal Analysis of Schottky-Barrier p-MOSFET2008/05/01
New Sustain Waveform for Improving Luminous Efficiency in Wide-Gap Plasma-Display Panel2008/05/01
Charge Collection From Within a Collecting Junction Well2008/05/01
Analysis of the Effects of Fringing Electric Field on FinFET Device Performance and Structural Optimization Using 3-D Simulation2008/05/01
Reliability Mechanisms of LTPS-TFT With $\hbox{HfO}_{2}$ Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress2008/05/01
Anomalous Hot-Carrier-Induced Increase in Saturation-Region Drain Current in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors2008/05/01
A Method for Current Spreading Analysis and Electrode Pattern Design in Light-Emitting Diodes2008/05/01
Manufacturable Processes for $\leq$ 32-nm-node CMOS Enhancement by Synchronous Optimization of Strain-Engineered Channel and External Parasitic Resistances2008/05/01
Prevention of Boundary Image Sticking in an AC Plasma Display Panel Using a Vacuum Sealing Process2008/06/01
Driving Characteristics of a High-Efficacy AC PDP With an Auxiliary Electrode2008/06/01
A PSP-Based Small-Signal MOSFET Model for Both Quasi-Static and Nonquasi-Static Operations2008/06/01
A Quasi-Two-Dimensional Compact Drain–Current Model for Undoped Symmetric Double-Gate MOSFETs Including Short-Channel Effects2008/06/01
Lateral Nonuniformity Effects of Border Traps on the Characteristics of Metal–Oxide–Semiconductor Field-Effect Transistors Subjected to High-Field Stresses2008/06/01
Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement2008/06/01