IEEE Transactions on Electron Devices

Title Publication Date Language Citations
Comparison of MONOS Memory Device Integrity When Using $\hbox{Hf}_{1 - x - y}\hbox{N}_{x}\hbox{O}_{y}$ Trapping Layers With Different N Compositions2008/06/01
Shallow-Trench-Isolation (STI)-Induced Mechanical-Stress-Related Kink-Effect Behaviors of 40-nm PD SOI NMOS Device2008/06/01
Three-Dimensional Simulation of Dopant-Fluctuation-Induced Threshold Voltage Dispersion in Nonplanar MOS Structures Targeting Flash EEPROM Transistors2008/06/01
New Observation of Mobility and Reliability Dependence on Mechanical Film Stress in Strained Silicon CMOSFETs2008/06/01
Statistical Compact Model Parameter Extraction by Direct Fitting to Variations2008/06/01
A Novel Two-Transistor Floating-Body/Gate Cell for Low-Power Nanoscale Embedded DRAM2008/06/01
A MOS Gated Power Semiconductor Switch Using Band-to-Band Tunneling and Avalanche Injection Mechanism2008/06/01
First Observation of Bias Oscillations in GaN Gunn Diodes on GaN Substrate2008/06/01
A Statistical Reliability Model for Single-Electron Threshold Logic2008/06/01
On Common–Base Avalanche Instabilities in SiGe HBTs2008/06/01
Screening Effects Between Field-Enhancing Patterned Carbon Nanotubes: A Numerical Study2008/06/01
Trapped-Hole-Enhanced Erase-Level Shift by FN-Stress Disturb in Sub-90-nm-Node Embedded SONOS Memory2008/06/01
ESD Protection Design With On-Chip ESD Bus and High-Voltage-Tolerant ESD Clamp Circuit for Mixed-Voltage I/O Buffers2008/06/01
Avalanche Breakdown Due to 3-D Effects in the Impact-Ionization MOS (I-MOS) on SOI: Reliability Issues2008/06/01
Short-Channel Characteristics of Self-Aligned $\Pi$-Shaped Source/Drain Ultrathin SOI MOSFETs2008/06/01
Bandstructure Effects in Silicon Nanowire Electron Transport2008/06/01