Metrology and Measurement Systems is a peer-reviewed journal focusing on advances in metrology, measurement techniques, and instrumentation. The journal publishes original research articles, reviews, and technical notes related to both theoretical and practical aspects of measurement science. It aims to provide a platform for the exchange of knowledge and innovation in the field of metrology.
Key areas covered include length, mass, time, temperature, electrical quantities, and chemical measurements. The journal highlights novel measurement methods, sensor technologies, and instrumentation systems for various applications. Attention is also given to uncertainty analysis, calibration, and traceability in measurement processes. The journal discusses standards and international cooperation in metrology.
Metrology and Measurement Systems targets researchers, engineers, and practitioners working in industries and academia who are involved in developing and applying measurement techniques. The journal contributes to improving the accuracy, reliability, and comparability of measurements worldwide. It is indexed in databases such as Scopus, Web of Science, and Inspec.