Surface and Interface Analysis is an international journal devoted to the development and application of techniques for characterizing surfaces, interfaces, and thin films. It serves as a forum for researchers to share advances in this field.
The journal covers a wide array of techniques, including electron spectroscopy, ion scattering, secondary ion mass spectrometry, scanning probe microscopy, and surface-enhanced raman scattering. Publishes original research articles, reviews, and short communications. High quality content to reach physicists, chemists, materials scientists, and engineers. Indexed in known scientific databases.
Focusing on innovation and practical applications, Surface and Interface Analysis helps to shape the future of surface science and its impact on materials science, nanotechnology, and other fields. The journal promotes the creation of more durable, efficient, and functional materials.