A Method of Lifetime Analysis Based on Small Censored Date

Article Properties
  • DOI (url)
    10.5023/jappstat.38.87
  • Publication Date
    2009/01/01
  • Journal
    Ouyou toukeigaku
  • Indian UGC (journal)
  • Refrences
    18
  • Hirotada Honda
  • Hiroyuki Kita
  • Yuichi Naruse
  • Hiroshi Aoyagi
  • Shigehiro Miura
Refrences
Title Journal Journal Categories Citations Publication Date
Title 1994
Title 1990
10.1109/WSC.2001.977264
Asymptotic Theory of Certain "Goodness of Fit" Criteria Based on Stochastic Processes The Annals of Mathematical Statistics 1,916 1952
Estimators of 2-parameter Weibull distributions from incomplete data with residual lifetimes IEEE Transactions on Reliability
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
 7 1993