| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| Fatigue Testing and Analysis of Results. | 1961 | |||
| 10.1109/TPAS.1978.354668 | ||||
| Dielectric breakdown strength affected by the lamellar configuration in XLPE insulation at a semiconducting interface | IEEE Transactions on Electrical Insulation | 21 | 1989 | |
| 10.1109/TEI.1981.298364 | ||||
| 10.1143/JJAP.27.572 |