激光干扰和损伤CMOS图像传感器研究进展（特邀）
Article Properties
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LanguageEnglish
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DOI (url)
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Publication Date2023/01/01
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Journal
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Indian UGC (journal)
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Refrences73
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温佳起 Wen Jiaqi
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卞进田 Bian Jintian
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李欣 Li Xin
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孔辉 Kong Hui
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郭磊 Guo Lei
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吕国瑞 Lv Guorui
Cite
Wen Jiaqi 温佳起, et al. “激光干扰和损伤CMOS图像传感器研究进展（特邀）”. Infrared and Laser Engineering, vol. 52, no. 6, 2023, p. 20230269, https://doi.org/10.3788/irla20230269.
Wen Jiaqi 温., Bian Jintian 卞., Li Xin 李., Kong Hui 孔., Guo Lei 郭., & Lv Guorui 吕. (2023). 激光干扰和损伤CMOS图像传感器研究进展（特邀）. Infrared and Laser Engineering, 52(6), 20230269. https://doi.org/10.3788/irla20230269
Wen Jiaqi 温佳起, Bian Jintian 卞进田, Li Xin 李欣, Kong Hui 孔辉, Guo Lei 郭磊, and Lv Guorui 吕国瑞. “激光干扰和损伤CMOS图像传感器研究进展（特邀）”. Infrared and Laser Engineering 52, no. 6 (2023): 20230269. https://doi.org/10.3788/irla20230269.
Wen Jiaqi 温, Bian Jintian 卞, Li Xin 李, Kong Hui 孔, Guo Lei 郭, Lv Guorui 吕. 激光干扰和损伤CMOS图像传感器研究进展（特邀）. Infrared and Laser Engineering. 2023;52(6):20230269.
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Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| Evolution of image sensor architectures with stacked device technologies | 2022 | |||
| Damage thresholds of silicon-based cameras for in-band and out-of-band laser expositions | 2022 | |||
| 复合激光损伤CMOS图像传感器实验研究 | Infrared and Laser Engineering | 2022 | ||
Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays | Sensors |
| 5 | 2022 |
| Impact of threshold assessment methods in laser-induced damage measurements using the examples of CCD, CMOS, and DMD | 2021 |