双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法

Article Properties
  • Language
    English
  • Publication Date
    2023/01/01
  • Indian UGC (journal)
  • Refrences
    43
  • 张业奇 Zhang Yeqi
  • 王贞福 Wang Zhenfu
  • 李特 Li Te
  • 陈琅 Chen Lang
  • 张佳晨 Zhang Jiachen
  • 吴顺华 Wu Shunhua
  • 刘嘉辰 Liu Jiachen
  • 杨国文 Yang Guowen
Cite
Zhang Yeqi 张业奇, et al. “双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法”. Infrared and Laser Engineering, vol. 52, no. 5, 2023, p. 20220592, https://doi.org/10.3788/irla20220592.
Zhang Yeqi 张., Wang Zhenfu 王., Li Te 李., Chen Lang 陈., Zhang Jiachen 张., Wu Shunhua 吴., Liu Jiachen 刘., & Yang Guowen 杨. (2023). 双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法. Infrared and Laser Engineering, 52(5), 20220592. https://doi.org/10.3788/irla20220592
Zhang Yeqi 张业奇, Wang Zhenfu 王贞福, Li Te 李特, Chen Lang 陈琅, Zhang Jiachen 张佳晨, Wu Shunhua 吴顺华, Liu Jiachen 刘嘉辰, and Yang Guowen 杨国文. “双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法”. Infrared and Laser Engineering 52, no. 5 (2023): 20220592. https://doi.org/10.3788/irla20220592.
Zhang Yeqi 张, Wang Zhenfu 王, Li Te 李, Chen Lang 陈, Zhang Jiachen 张, Wu Shunhua 吴, et al. 双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法. Infrared and Laser Engineering. 2023;52(5):20220592.