Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
Simulation study on single-event burnout in field-plated Ga2O3 MOSFETs | Microelectronics Reliability |
| 3 | 2023 |
Effects of fast and thermal neutron irradiation on Ga-polar and N-polar GaN diodes | Journal of Applied Physics |
| 3 | 2023 |
An Analysis of the Significance of the 14N(n,p)14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs | IEEE Transactions on Nuclear Science |
| 2023 | |
Characterization and simulation of terrestrial neutron induced destructive single-event effects in Gallium Nitride (GaN) power devices | IEEE Transactions on Nuclear Science |
| 2023 | |
Neutron Displacement Damage cross Section in GaN: Numerical Evaluations and Differences with Si | IEEE Transactions on Nuclear Science |
| 2023 |