Reaction-Diffusion in the Cu–Sn System

Article Properties
Refrences
Title Journal Journal Categories Citations Publication Date
Diffusion layer growth in a binary system Journal of Nuclear Materials
  • Science: Chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
  • Technology: Electrical engineering. Electronics. Nuclear engineering
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
27 1966
Zur Berechnung von Diffusionskoeffizienten bei ein- und mehrphasiger Diffusion in festen Legierungen Zeitschrift für Physikalische Chemie
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry
77 1952
Interdiffusion and reaction in bimetallic Cu-Sn thin films Acta Metallurgica 371 1973
Kirkendall effect studies in copper-tin diffusion couples Scripta Metallurgica 30 1972
Diffusion Formation of Intermetallic Compounds in Au-Al Couples by Use of Evapolated Al Films Journal of the Japan Institute of Metals and Materials
  • Technology: Mining engineering. Metallurgy
  • Technology: Mining engineering. Metallurgy
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
6 1974
Citations
Title Journal Journal Categories Citations Publication Date
Self-Healing of Kirkendall Voids and IMC Growth in the Interfacial Reaction of Novel Ni/Cu bi-layer Barrier and Solder Electronic Materials Letters
  • Science: Chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2024
Solid/solid state interfacial reactions in the lead-free solders/Cu- 2.3%wt. Fe alloy (C194) couples Journal of the Taiwan Institute of Chemical Engineers
  • Technology: Chemical technology: Chemical engineering
  • Technology: Chemical technology: Chemical engineering
  • Science: Chemistry
2024
Effects of electrodeposited Co–W and Co–Fe–W diffusion barrier layers on the evolution of Sn/Cu interface Materials Chemistry and Physics
  • Science: Chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2024
Nucleation and Location of Kirkendall Voids at the Tin‐Based Solder/Copper Joint: A Review

Advanced Engineering Materials
  • Science: Chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
2 2023
Diffusion barrier property of Co-W layer compared with Ni layer in fine pitch micro-bumps during high temperature storage Materials Letters
  • Science: Chemistry
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
3 2023
Citations Analysis
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials 157 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Studies on superconducting Nb3Sn formed from high-tin-concentration Cu-Sn alloy and was published in 1978. The most recent citation comes from a 2024 study titled Self-Healing of Kirkendall Voids and IMC Growth in the Interfacial Reaction of Novel Ni/Cu bi-layer Barrier and Solder. This article reached its peak citation in 2009, with 14 citations. It has been cited in 62 different journals, 3% of which are open access. Among related journals, the Journal of Electronic Materials cited this research the most, with 32 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year