Using Image Data for Machine Learning-Based Defect Detection

Article Properties
  • Language
    English
  • DOI (url)
    10.17929/tqs.9.74
  • Publication Date
    2023/12/01
  • Journal
    Total Quality Science
  • Indian UGC (journal)
  • Refrences
    10
  • Kanki Fujita Department of Industrial and Systems Engineering, Faculty of Science and Technology,Tokyo University of Science
  • Shizu Itaka Department of Industrial and Systems Engineering, Faculty of Science and Technology,Tokyo University of Science
  • Tomomichi Suzuki Department of Industrial and Systems Engineering, Faculty of Science and Technology,Tokyo University of Science
Cite
Fujita, Kanki, et al. “Using Image Data for Machine Learning-Based Defect Detection”. Total Quality Science, vol. 9, no. 2, 2023, pp. 74-82, https://doi.org/10.17929/tqs.9.74.
Fujita, K., Itaka, S., & Suzuki, T. (2023). Using Image Data for Machine Learning-Based Defect Detection. Total Quality Science, 9(2), 74-82. https://doi.org/10.17929/tqs.9.74
Fujita K, Itaka S, Suzuki T. Using Image Data for Machine Learning-Based Defect Detection. Total Quality Science. 2023;9(2):74-82.
Refrences
Title Journal Journal Categories Citations Publication Date
<b>Defect Detection for Improving Inspection Process </b><b>Using Orthogonal Array: A Case Study of Cylindrical Metal Products</b> Total Quality Science 1 2017
10.1016/S0031-3203(02)00040-7
10.1117/12.767755
10.1016/S0031-3203(99)00055-2
10.2208/jscejhe.74.5_I_607