Silicon carbide LED

Article Properties
Cite
Vlaskina, S.I. “Silicon Carbide LED”. Semiconductor Physics, Quantum Electronics and Optoelectronics, vol. 5, no. 1, 2002, pp. 71-75, https://doi.org/10.15407/spqeo5.01.071.
Vlaskina, S. (2002). Silicon carbide LED. Semiconductor Physics, Quantum Electronics and Optoelectronics, 5(1), 71-75. https://doi.org/10.15407/spqeo5.01.071
Vlaskina S. Silicon carbide LED. Semiconductor Physics, Quantum Electronics and Optoelectronics. 2002;5(1):71-5.
Journal Category
Science
Physics
Refrences
Title Journal Journal Categories Citations Publication Date
2. M.A.Capano, R.Santhakumar, J.A.Cooper,Ir., and M.R.Meloch, SiC Ion Implantation Research at Purdue, USA(internet information), 2002.
1. S.I.Vlaskina, K.W.Kim, Y.S.Kim, Y.P.Lee, G.S.Svechnikov, Optoelectronics Devices on Silicon Carbide // Journal of the Korean Physical Society, 30(1),pp.117-121(1997).
Citations
Title Journal Journal Categories Citations Publication Date
Achievements and prospects: 25 years of SPQEO journal

 Semiconductor Physics, Quantum Electronics and Optoelectronics
  • Science: Physics
  • Science: Physics
 2023
Silicon Carbide Photonics Bridging Quantum Technology ACS Photonics
  • Technology: Chemical technology
  • Science: Chemistry
  • Science: Physics: Optics. Light
  • Science: Physics
  • Science: Physics
  • Science: Physics: Acoustics. Sound
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
 39 2022
Introducing a new atomic parameter of energy scale for wideband semiconductors and binary materials SN Applied Sciences
  • Science
  • Technology
  • Science: Science (General)
 2019
Effects of ultra-smooth surface atomic step morphology on chemical mechanical polishing (CMP) performances of sapphire and SiC wafers Tribology International
  • Technology: Mechanical engineering and machinery
  • Technology: Mechanical engineering and machinery
  • Technology: Engineering (General). Civil engineering (General)
 86 2015
XPS, UV–vis spectroscopy and AFM studies on removal mechanisms of Si-face SiC wafer chemical mechanical polishing (CMP) Applied Surface Science
  • Science: Chemistry: Physical and theoretical chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
 85 2014
Citations Analysis
Category Category Repetition
Science: Physics7
Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials5
Technology: Chemical technology4
Science: Chemistry3
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks2
Science: Chemistry: Physical and theoretical chemistry1
Science: Physics: Optics. Light1
Science: Physics: Acoustics. Sound1
Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics1
Technology: Mechanical engineering and machinery1
Technology: Engineering (General). Civil engineering (General)1
Science1
Technology1
Science: Science (General)1
The category Science: Physics 7 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(100) by modeling and simulation and was published in 2004. The most recent citation comes from a 2023 study titled Achievements and prospects: 25 years of SPQEO journal. This article reached its peak citation in 2014, with 2 citations. It has been cited in 10 different journals, 20% of which are open access. Among related journals, the Semiconductor Physics, Quantum Electronics and Optoelectronics cited this research the most, with 2 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year