Ellipsometry and optical spectroscopy of low-dimensional family TMDs

Article Properties
Cite
Kravets, V.G. “Ellipsometry and Optical Spectroscopy of Low-Dimensional Family TMDs”. Semiconductor Physics, Quantum Electronics and Optoelectronics, vol. 20, no. 3, 2017, pp. 284-96, https://doi.org/10.15407/spqeo20.03.284.
Kravets, V. (2017). Ellipsometry and optical spectroscopy of low-dimensional family TMDs. Semiconductor Physics, Quantum Electronics and Optoelectronics, 20(3), 284-296. https://doi.org/10.15407/spqeo20.03.284
Kravets V. Ellipsometry and optical spectroscopy of low-dimensional family TMDs. Semiconductor Physics, Quantum Electronics and Optoelectronics. 2017;20(3):284-96.
Journal Category
Science
Physics
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Citations
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Citations Analysis
The category Science: Physics 13 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled A simple approach to analyze layer-dependent optical properties of few-layer transition metal dichalcogenide thin films and was published in 2018. The most recent citation comes from a 2024 study titled The conductivity effect of the top coating on optical properties of thin Cu(Ag)-layered structures. This article reached its peak citation in 2023, with 6 citations. It has been cited in 16 different journals, 18% of which are open access. Among related journals, the Optical and Quantum Electronics cited this research the most, with 3 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year