X-Ray Diffraction Study of Confined Porous Silicon Membranes

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Cite
Milita, S., et al. “X-Ray Diffraction Study of Confined Porous Silicon Membranes”. Journal of The Electrochemical Society, vol. 148, no. 8, 2001, p. G447, https://doi.org/10.1149/1.1385381.
Milita, S., Servidori, M., Maccagnani, P., Cembali, F., Pozzi, P., & Dori, L. (2001). X-Ray Diffraction Study of Confined Porous Silicon Membranes. Journal of The Electrochemical Society, 148(8), G447. https://doi.org/10.1149/1.1385381
Milita, S., M. Servidori, P. Maccagnani, F. Cembali, P. Pozzi, and L. Dori. “X-Ray Diffraction Study of Confined Porous Silicon Membranes”. Journal of The Electrochemical Society 148, no. 8 (2001): G447. https://doi.org/10.1149/1.1385381.
Milita S, Servidori M, Maccagnani P, Cembali F, Pozzi P, Dori L. X-Ray Diffraction Study of Confined Porous Silicon Membranes. Journal of The Electrochemical Society. 2001;148(8):G447.
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Refrences
Title Journal Journal Categories Citations Publication Date
X-Ray Synchrotron Topography Investigation of Porous Silicon Formed by Patterning in Localized Areas Journal of The Electrochemical Society
  • Science: Chemistry
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Chemistry: Physical and theoretical chemistry
 1 2001
10.1023/A:1009659409958 Journal of Porous Materials
  • Science: Chemistry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
 2000
10.1023/A:1009603308141 Journal of Porous Materials
  • Science: Chemistry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
 2000
10.1023/A:1009647007232 Journal of Porous Materials
  • Science: Chemistry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
 2000
10.1023/A:1009690805415 Journal of Porous Materials
  • Science: Chemistry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
 2000
Refrences Analysis
Category Category Repetition
Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials18
Science: Chemistry16
Science: Chemistry: Physical and theoretical chemistry12
Technology: Chemical technology8
Science: Physics8
Science: Chemistry: Crystallography2
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials 18 is the most frequently represented among the references in this article. It primarily includes studies from Journal of Porous Materials and Journal of Applied Physics. The chart below illustrates the number of referenced publications per year.
Refrences used by this article by year