The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation | Instruments and Experimental Techniques |
- Technology: Engineering (General). Civil engineering (General)
- Science: Mathematics: Instruments and machines
- Technology: Engineering (General). Civil engineering (General)
| 1 | 2019 |
10.57415/xshinpo.43.0_139 | | | | 2012 |
Planar waveguide‐resonator: a new device for x‐ray optics | X-Ray Spectrometry |
- Science: Chemistry: Physical and theoretical chemistry
- Science: Chemistry: Analytical chemistry
- Science: Chemistry: Analytical chemistry
- Science: Chemistry
| 20 | 2004 |
Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
- Science: Mathematics: Instruments and machines
- Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
- Science: Physics: Atomic physics. Constitution and properties of matter
- Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity
- Science: Chemistry: Analytical chemistry
- Science: Physics
| 1 | 1996 |
Algorithms for the rapid simulation of Rutherford backscattering spectra | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
- Science: Mathematics: Instruments and machines
- Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
- Science: Physics: Atomic physics. Constitution and properties of matter
- Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity
- Science: Chemistry: Analytical chemistry
- Science: Physics
| 4 | 1985 |