Ion Beams and X-ray Methods for the Planar Nanostructures Diagnostics

Article Properties
Refrences
Title Journal Journal Categories Citations Publication Date
The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation Instruments and Experimental Techniques
  • Technology: Engineering (General). Civil engineering (General)
  • Science: Mathematics: Instruments and machines
  • Technology: Engineering (General). Civil engineering (General)
1 2019
10.57415/xshinpo.43.0_139 2012
Planar waveguide‐resonator: a new device for x‐ray optics

X-Ray Spectrometry
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Chemistry: Analytical chemistry
  • Science: Chemistry: Analytical chemistry
  • Science: Chemistry
20 2004
Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • Science: Mathematics: Instruments and machines
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
  • Science: Physics: Atomic physics. Constitution and properties of matter
  • Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity
  • Science: Chemistry: Analytical chemistry
  • Science: Physics
1 1996
Algorithms for the rapid simulation of Rutherford backscattering spectra Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • Science: Mathematics: Instruments and machines
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
  • Science: Physics: Atomic physics. Constitution and properties of matter
  • Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity
  • Science: Chemistry: Analytical chemistry
  • Science: Physics
4 1985