Multireflection Planar Time-of-Flight Mass Analyzer. II: The High-Resolution Mode
Article Properties
-
LanguageEnglish
-
DOI (url)
-
Publication Date2005/01/01
-
Journal
-
Indian UGC (journal)
-
Refrences10
-
Citations29
-
A. N. Verentchikov
Journal Categories
Science
Physics
Technology
Chemical technology
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
You May Also Like
- The acoustical Grüneisen constants of solids
- The effect of electric field on metal-insulator phase transition in vanadium dioxide
- A condition imposed on the electromagnetic polarizability of a bianisotropic lossless scatterer
- On the history of the discovery of nanodiamond synthesis
- Low-dimensional thermoelectric materials
Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| 10.1016/S1387-3806(03)00127-1 | International Journal of Mass Spectrometry |
| 2003 | |
Multi‐turn time‐of‐flight mass spectrometers with electrostatic sectors | Journal of Mass Spectrometry |
| 81 | 2003 |
| A. N. Verentchikov, M. I. Yavor, Yu. I. Khasin, et al., Zh. Tekh. Fiz. 75(1), 74 (2005) [Tech. Phys. 50, 73 (2005)]. | 2005 | |||
| Yu. I. Khasin, A. N. Verentchikov, M. A. Gavrik, et al., Nauchn. Priborostroenie 14(2), 59 (2004). | 2004 | |||
| Yu. I. Hasin, M. A. Gavrik, V. N. Demidov, et al., Nauchn. Priborostroenie 14(2), 72 (2004). | 2004 |
Refrences Analysis
The category
Science: Chemistry: Analytical chemistry 6
is the most frequently represented among the references in this article. It primarily includes studies from International Journal of Mass Spectrometry and Journal of Mass Spectrometry. The chart below illustrates the number of referenced publications per year.
Refrences used by this article by year
Citations
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
Crowd control of ions in the Astral analyzer | Journal of Mass Spectrometry |
| 2024 | |
High‐resolution multi‐reflection time‐of‐flight mass spectrometer with atmospheric pressure interface | Rapid Communications in Mass Spectrometry |
| 2024 | |
| Proof of principle for enhanced resolution multi-pass methods for the Astral analyzer | International Journal of Mass Spectrometry |
| 1 | 2024 |
| Characteristics on catalytic removal of sulfur and nitrogen from atmospheric residues at the molecular level | Catalysis Today |
| 5 | 2022 |
| Imaging properties of a multi-reflection time-of-flight mass analyzer | International Journal of Mass Spectrometry |
| 2 | 2021 |
Citations Analysis
The category
Science: Chemistry: Analytical chemistry 21
is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Miniaturized High-Resolution Time-of-Flight Mass Spectrometer MULTUM-S II with an Infinite Flight Path and was published in 2010. The most recent citation comes from a 2024 study titled High‐resolution multi‐reflection time‐of‐flight mass spectrometer with atmospheric pressure interface. This article reached its peak citation in 2024, with 3 citations. It has been cited in 17 different journals. Among related journals, the International Journal of Mass Spectrometry cited this research the most, with 9 citations. The chart below illustrates the annual citation trends for this article.