The category
Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics 1
is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled
Cryogenic-Aware Forward Body Biasing in Bulk CMOS and was published in 2024. The most recent citation comes from a 2024 study titled
Cryogenic-Aware Forward Body Biasing in Bulk CMOS. This article reached its peak citation in 2024, with 1 citations. It has been cited in 1 different journals. Among related journals, the
IEEE Electron Device Letters cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.