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Detecting Line Segments in Motion-Blurred Images With Events
Article Properties
DOI (url)
10.1109/tpami.2023.3334877
Publication Date
2024/05/01
Journal
IEEE Transactions on Pattern Analysis and Machine Intelligence
Indian UGC (journal)
Refrences
53
Huai
Yu
School of Electronic Information, Wuhan University, Wuhan, China
ORCID (unauthenticated)
Hao
Li
School of Electronic Information, Wuhan University, Wuhan, China
ORCID (unauthenticated)
Wen
Yang
School of Electronic Information, Wuhan University, Wuhan, China
ORCID (unauthenticated)
Lei
Yu
School of Electronic Information, Wuhan University, Wuhan, China
ORCID (unauthenticated)
Gui-Song
Xia
School of Computer Science, Wuhan University, Wuhan, China
ORCID (unauthenticated)
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Engineering (General)
Civil engineering (General)
Technology
Mechanical engineering and machinery
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Citations
Publication Date
Adam: A method for stochastic optimization
ESIM: An open event camera simulator
10.1109/CVPR42600.2020.00286
10.1109/CVPR46437.2021.00424
10.1007/978-3-030-30645-8_15
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