Home
Research Trends
Papers list
Open Access Journals
All Journals
Search in Journals
Contact us
The 41st IEEE VLSI Test Symposium
Article Properties
DOI (url)
10.1109/mdat.2023.3292798
Publication Date
2023/10/01
Journal
IEEE Design & Test
Indian UGC (journal)
Naghmeh
Karimi
University of Maryland Baltimore County, Baltimore, MD, USA
ORCID (unauthenticated)
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Computer software
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware