Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques

Article Properties
  • DOI (url)
    10.1109/mdat.2016.2590985
  • Publication Date
    2016/12/01
  • Journal
    IEEE Design & Test
  • Indian UGC (journal)
  • Refrences
    12
  • Citations
    1
  • Manuel J. Barragan
  • Haralampos-G. Stratigopoulos
  • Salvador Mir
  • Herve Le-Gall
  • Neha Bhargava
  • Ankur Bal
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Computer software
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Refrences
Title Journal Journal Categories Citations Publication Date
Scalable and efficient analog parametric fault identification 0
Ternary stimulus for fully digital dynamic testing of SC $\Sigma\Delta$ ADCs 2012
Evaluation of digital ternary stimuli for dynamic test of $\Sigma\Delta$ ADCs 0
10.1109/MDAT.2014.2361719
10.1109/TCAD.2012.2185931
Citations
Title Journal Journal Categories Citations Publication Date
Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers IEEE Open Journal of Circuits and Systems
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
 2023
Citations Analysis
Category Category Repetition
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks1
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks 1 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers and was published in 2023. The most recent citation comes from a 2023 study titled Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers. This article reached its peak citation in 2023, with 1 citations. It has been cited in 1 different journals, 100% of which are open access. Among related journals, the IEEE Open Journal of Circuits and Systems cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year