CMOS 16FF Digital Power Amplifier RF Reliability Characterization

Article Properties
  • DOI (url)
    10.1109/lssc.2023.3314458
  • Publication Date
    2023/01/01
  • Journal
    IEEE Solid-State Circuits Letters
  • Indian UGC (journal)
  • Refrences
    7
  • L. Zohar Wireless Communication Solutions, Intel Corporate Quality Network, Haifa, Israel ORCID (unauthenticated)
  • I. Shternberg Wireless Communication Solutions, Intel Corporate Quality Network, Haifa, Israel
  • B. Khamaisi Wireless Communication Solutions Division, Intel Corporation, Haifa, Israel ORCID (unauthenticated)
  • A. Nazimov Wireless Communication Solutions Division, Intel Corporation, Haifa, Israel ORCID (unauthenticated)
  • A. Ben-Bassat Wireless Communication Solutions Division, Intel Corporation, Haifa, Israel ORCID (unauthenticated)
  • O. Degani Wireless Communication Solutions Division, Intel Corporation, Haifa, Israel
Journal Categories
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Refrences
Title Journal Journal Categories Citations Publication Date
Stress analysis and temperature impact of negative bias temperature instability (NBTI) on a CMOS inverter circuit 2012
10.1109/RELPHY.2008.4558942
10.1109/RFIC.2009.5135554
10.1109/IRPS.2011.5784445
10.1109/IRPS.2017.7936367