A 0.26-pJ·K2 2400-μm2 Digital Temperature Sensor in 55-nm CMOS

Article Properties
Journal Categories
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Refrences
Title Journal Journal Categories Citations Publication Date
Title 2020
10.1109/JSSC.2017.2746671
Low power Schmitt trigger circuit Electronics Letters
  • Technology: Electrical engineering. Electronics. Nuclear engineering
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
41 2002
10.1109/ISSCC.2017.7870310
10.1109/JSSC.2016.2598765
Citations
Title Journal Journal Categories Citations Publication Date
A Sub-1 V Capacitively Biased BJT-Based Temperature Sensor With an Inaccuracy of ±0.15 °C (3σ) From—55 °C to 125 °C IEEE Journal of Solid-State Circuits
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
2023
Citations Analysis
The category Technology: Chemical technology 1 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled A Sub-1 V Capacitively Biased BJT-Based Temperature Sensor With an Inaccuracy of ±0.15 °C (3σ) From—55 °C to 125 °C and was published in 2023. The most recent citation comes from a 2023 study titled A Sub-1 V Capacitively Biased BJT-Based Temperature Sensor With an Inaccuracy of ±0.15 °C (3σ) From—55 °C to 125 °C. This article reached its peak citation in 2023, with 1 citations. It has been cited in 1 different journals. Among related journals, the IEEE Journal of Solid-State Circuits cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year