A Cryogenic CMOS Parametric Amplifier
Article Properties
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DOI (url)
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Publication Date2020/01/01
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Indian UGC (journal)
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Refrences11
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Citations1
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Mohammadreza Mehrpoo ORCID (unauthenticated)
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Fabio Sebastiano
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Edoardo Charbon
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Masoud Babaie
Journal Categories
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| Title | 1961 | |||
| 10.21236/AD0411965 | ||||
| 10.1016/B978-1-4831-9945-0.50010-6 | ||||
| 10.1109/TMTT.2011.2178318 | ||||
| 10.1109/ISSCC.2008.4523060 |
Citations
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
Cryogenic probe for low-noise, high-frequency electronic measurements | Review of Scientific Instruments |
| 2022 |
Citations Analysis
| Category | Category Repetition |
|---|---|
| Science: Mathematics: Instruments and machines | 1 |
| Science: Physics | 1 |
| Science: Chemistry: Analytical chemistry | 1 |
| Science: Chemistry | 1 |
The category
Science: Mathematics: Instruments and machines 1
is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Cryogenic probe for low-noise, high-frequency electronic measurements and was published in 2022. The most recent citation comes from a 2022 study titled Cryogenic probe for low-noise, high-frequency electronic measurements. This article reached its peak citation in 2022, with 1 citations. It has been cited in 1 different journals. Among related journals, the Review of Scientific Instruments cited this research the most, with 1 citations. The chart below illustrates the annual citation trends for this article.