Fully Integrated Avalanche Noise Sources: Reproducibility and Stability Assessment

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Simoncini, Guendalina, et al. “Fully Integrated Avalanche Noise Sources: Reproducibility and Stability Assessment”. IEEE Microwave and Wireless Technology Letters, vol. 33, no. 11, 2023, pp. 1525-8, https://doi.org/10.1109/lmwt.2023.3312915.
Simoncini, G., Palazzi, V., Orecchini, G., & Alimenti, F. (2023). Fully Integrated Avalanche Noise Sources: Reproducibility and Stability Assessment. IEEE Microwave and Wireless Technology Letters, 33(11), 1525-1528. https://doi.org/10.1109/lmwt.2023.3312915
Simoncini G, Palazzi V, Orecchini G, Alimenti F. Fully Integrated Avalanche Noise Sources: Reproducibility and Stability Assessment. IEEE Microwave and Wireless Technology Letters. 2023;33(11):1525-8.
Journal Categories
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Engineering (General)
Civil engineering (General)
Refrences
Title Journal Journal Categories Citations Publication Date
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Radiometer equation and analysis of systematic errors for the NIST automated radiometers 1327
10.1109/ACCESS.2022.3198669
10.1109/JSSC.2021.3053242
Characterization and applications of on-wafer diode noise sources IEEE Transactions on Microwave Theory and Techniques
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
 10 1998