An Ultrawideband Differential Magnetic-Field Probe for Near-Field Scanning

Article Properties
Cite
Wang, Lei, et al. “An Ultrawideband Differential Magnetic-Field Probe for Near-Field Scanning”. IEEE Microwave and Wireless Technology Letters, vol. 33, no. 2, 2023, pp. 224-7, https://doi.org/10.1109/lmwc.2022.3204456.
Wang, L., En, Y., & Zhu, Z. (2023). An Ultrawideband Differential Magnetic-Field Probe for Near-Field Scanning. IEEE Microwave and Wireless Technology Letters, 33(2), 224-227. https://doi.org/10.1109/lmwc.2022.3204456
Wang L, En Y, Zhu Z. An Ultrawideband Differential Magnetic-Field Probe for Near-Field Scanning. IEEE Microwave and Wireless Technology Letters. 2023;33(2):224-7.
Journal Categories
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Engineering (General)
Civil engineering (General)
Refrences
Title Journal Journal Categories Citations Publication Date
Microwave Engineering 2005
10.1109/JSEN.2018.2869908
10.1109/TEMC.2017.2705641
10.1109/ISEMC.2013.6670396
10.1109/ISEMC.2017.8077930
Citations
Title Journal Journal Categories Citations Publication Date
A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components IEEE Magnetics Letters
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
2023
Citations Analysis
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks 1 is the most commonly referenced area in studies that cite this article.