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A Benchmark of Cryo-CMOS Embedded SRAM/DRAMs in 40-nm CMOS
Article Properties
DOI (url)
10.1109/jssc.2024.3385696
Publication Date
2024/01/01
Journal
IEEE Journal of Solid-State Circuits
Indian UGC (journal)
Rob A.
Damsteegt
Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands
ORCID (unauthenticated)
Ramon W. J.
Overwater
Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands
ORCID (unauthenticated)
Masoud
Babaie
QuTech, Delft, The Netherlands
ORCID (unauthenticated)
Fabio
Sebastiano
Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Netherlands
ORCID (unauthenticated)
Journal Categories
Technology
Chemical technology
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Engineering (General)
Civil engineering (General)
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