Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments

Article Properties
  • DOI (url)
    10.1109/jsen.2024.3371475
  • Publication Date
    2024/04/15
  • Journal
    IEEE Sensors Journal
  • Indian UGC (journal)
  • Refrences
    32
  • Shuhuan Han School of Automation and Information Engineering, Xi’an University of Technology, Xi’an, Shaanxi, China ORCID (unauthenticated)
  • Yanxi Yang School of Automation and Information Engineering, Xi’an University of Technology, Xi’an, Shaanxi, China ORCID (unauthenticated)
  • Xinyu Zhang School of Automation and Information Engineering, Xi’an University of Technology, Xi’an, Shaanxi, China ORCID (unauthenticated)
  • Xinjie Li School of Automation and Information Engineering, Xi’an University of Technology, Xi’an, Shaanxi, China
Cite
Han, Shuhuan, et al. “Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments”. IEEE Sensors Journal, vol. 24, no. 8, 2024, pp. 13439-46, https://doi.org/10.1109/jsen.2024.3371475.
Han, S., Yang, Y., Zhang, X., & Li, X. (2024). Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments. IEEE Sensors Journal, 24(8), 13439-13446. https://doi.org/10.1109/jsen.2024.3371475
Han, Shuhuan, Yanxi Yang, Xinyu Zhang, and Xinjie Li. “Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments”. IEEE Sensors Journal 24, no. 8 (2024): 13439-46. https://doi.org/10.1109/jsen.2024.3371475.
Han S, Yang Y, Zhang X, Li X. Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments. IEEE Sensors Journal. 2024;24(8):13439-46.
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Real-time phase measuring profilometry based on single-shot four-grayscale fringe projection 2021