A Survey and Recent Advances: Machine Intelligence in Electronic Testing | Journal of Electronic Testing |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
| | 2024 |
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation | Journal of Electronic Testing |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
| | 2023 |
A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking | IEEE Transactions on Computers |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
| | 2023 |
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| | 2023 |
A New Static Compaction of Deterministic Test Sets | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| | 2023 |