Test pattern generation using Boolean satisfiability

Article Properties
Journal Categories
Science
Mathematics
Instruments and machines
Electronic computers
Computer science
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Computer engineering
Computer hardware
Technology
Engineering (General)
Civil engineering (General)
Refrences
Title Journal Journal Categories Citations Publication Date
Fault simulation for structured VLSI VLSI Design 1985
Evaluating search methods analytically 1982
A neutral netlist of 10 combinatorial benchmark circuits and a target translator in fortran 1985
A neutral netlist of 10 combinatorial benchmark circuits and a target translator in fortran 1990
A neutral netlist of 10 combinatorial benchmark circuits and a target translator in fortran 1986
Citations
Title Journal Journal Categories Citations Publication Date
A Survey and Recent Advances: Machine Intelligence in Electronic Testing Journal of Electronic Testing
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
2024
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation Journal of Electronic Testing
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
2023
A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking IEEE Transactions on Computers
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science: Computer software
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
2023
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Science: Mathematics: Instruments and machines: Electronic computers. Computer science
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
2023
A New Static Compaction of Deterministic Test Sets IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Engineering (General). Civil engineering (General)
2023
Citations Analysis
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware 93 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled A transitive closure algorithm for test generation and was published in 1993. The most recent citation comes from a 2024 study titled A Survey and Recent Advances: Machine Intelligence in Electronic Testing. This article reached its peak citation in 2012, with 10 citations. It has been cited in 50 different journals, 6% of which are open access. Among related journals, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems cited this research the most, with 46 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year