High-resolution induction thermography for detection of micro-cracks in Ti-6Al-4V alloys

Article Properties
  • Language
    English
  • Publication Date
    2024/01/22
  • Indian UGC (journal)
  • Refrences
    28
  • Nithin Puthiyaveettil Centre for Non-Destructive Evaluation, Indian Institute of Technology Madras, Chennai, India ORCID (unauthenticated)
  • Jalaj Kumar Defence Metallurgical Research Laboratory, DRDO, Hyderabad, India
  • Krishnan Balasubramaniam Centre for Non-Destructive Evaluation, Indian Institute of Technology Madras, Chennai, India
Journal Categories
Science
Mathematics
Instruments and machines
Science
Physics
Technology
Chemical technology
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
Refrences
Title Journal Journal Categories Citations Publication Date
Proceedings of the 19th World Conference on Non-Destructive Testing. Munich, Germany 2016
13th International Conference on Quantitative Infrared Thermography 2016
Testing and evaluation of infrared imaging systems 1998
Inductively excited lock-in thermography for PCB-vias. In: 2012 4th Electronic System-Integration Technology Conference; Amsterdam, Netherlands. IEEE 2012
17th World conference on nondestructive testing 2008