Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
Proceedings of the 19th World Conference on Non-Destructive Testing. Munich, Germany | 2016 | |||
13th International Conference on Quantitative Infrared Thermography | 2016 | |||
Testing and evaluation of infrared imaging systems | 1998 | |||
Inductively excited lock-in thermography for PCB-vias. In: 2012 4th Electronic System-Integration Technology Conference; Amsterdam, Netherlands. IEEE | 2012 | |||
17th World conference on nondestructive testing | 2008 |