3-D Optical Interference Microscopy at the Lateral Resolution

Article Properties
Cite
Lehmann, Peter, et al. “3-D Optical Interference Microscopy at the Lateral Resolution”. International Journal of Optomechatronics, vol. 8, no. 4, 2014, pp. 231-4, https://doi.org/10.1080/15599612.2014.942924.
Lehmann, P., Niehues, J., & Tereschenko, S. (2014). 3-D Optical Interference Microscopy at the Lateral Resolution. International Journal of Optomechatronics, 8(4), 231-241. https://doi.org/10.1080/15599612.2014.942924
Lehmann P, Niehues J, Tereschenko S. 3-D Optical Interference Microscopy at the Lateral Resolution. International Journal of Optomechatronics. 2014;8(4):231-4.
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Science
Physics
Optics
Light
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
Technology
Engineering (General)
Civil engineering (General)
Technology
Engineering (General)
Civil engineering (General)
Applied optics
Photonics
Technology
Mechanical engineering and machinery
Refrences
Title Journal Journal Categories Citations Publication Date
Title 2013
Title 2013
Title 2005
Polarization of Radiation by Gratings The Astrophysical Journal
  • Science: Astronomy: Astrophysics
  • Science: Astronomy
  • Science: Astronomy
  • Science: Astronomy
 13 1920
10.1364/AO.44.002202
Citations
Title Journal Journal Categories Citations Publication Date
Two-dimensional modelling of systematic surface height deviations in optical interference microscopy based on rigorous near field calculation Journal of Modern Optics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics: Acoustics. Sound
  • Science: Physics: Optics. Light
  • Science: Physics: Optics. Light
  • Science: Physics
 9 2020
Compensated Microsphere-Assisted Interference Microscopy Physical Review Applied
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
  • Science: Physics
 1 2020
High-resolution interference microscopy of binary phase diffractive optical elements OSA Continuum
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Science: Physics: Optics. Light
 2019
Modified Linnik microscopic interferometry for quantitative depth evaluation of diffraction-limited microgroove Measurement Science and Technology
  • Technology: Engineering (General). Civil engineering (General)
  • Science: Mathematics: Instruments and machines
  • Science: Chemistry: Analytical chemistry
  • Technology: Engineering (General). Civil engineering (General)
 2 2018
Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit Optics Express
  • Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics
  • Science: Physics: Optics. Light
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics: Optics. Light
  • Science: Physics
 2018
Citations Analysis
Category Category Repetition
Technology: Chemical technology6
Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials6
Science: Physics: Optics. Light5
Science: Physics5
Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics3
Technology: Engineering (General). Civil engineering (General)2
Science: Mathematics: Instruments and machines2
Technology: Mechanical engineering and machinery2
Science: Chemistry: Analytical chemistry1
Science: Physics: Acoustics. Sound1
Technology: Technology (General): Industrial engineering. Management engineering: Information technology1
Technology: Manufactures1
Science: Chemistry1
Science: Science (General): Cybernetics: Information theory1
The category Technology: Chemical technology 6 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Fundamental aspects of resolution and precision in vertical scanning white-light interferometry and was published in 2016. The most recent citation comes from a 2020 study titled Two-dimensional modelling of systematic surface height deviations in optical interference microscopy based on rigorous near field calculation. This article reached its peak citation in 2018, with 4 citations. It has been cited in 9 different journals, 33% of which are open access. Among related journals, the Optics Express cited this research the most, with 2 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year